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Test Rig for MEMS-accelerometers

Fulltext:


Research group:


Publication Type:

Conference/Workshop Paper

Venue:

MSW 2010, Micronano System Workshop


Abstract

MEMS-accelerometers are rather cheap, small and reliable motion sensors that have found new application areas and are available in a variety of performance. They exist in many different performance, such as single, dual or triple axis, for high- or low-g application, with analog or digital output, different packages and size etc. Their performance parameters also exist in a wide spectrum, like high sensitivity, bandwidth, noise density, temperature range, shock tolerance etc. Moreover, there are a variety of manufacturers that you can choose from. So when it is time to choose sensor, there are many aspects and parameters to take in the consideration of choosing the right accelerometer. If it is possible to managed to choose one sensor above all others, a question arises. How can you be sure that the chosen sensor fulfils its requirement specification?

Bibtex

@inproceedings{Gerdtman1797,
author = {Christer Gerdtman and Maria Lind{\'e}n},
title = {Test Rig for MEMS-accelerometers},
editor = { G{\"o}ran Stemme, Niclas Roxhed and Wouter van der Wijngaart},
month = {May},
year = {2010},
booktitle = {MSW 2010, Micronano System Workshop},
url = {http://www.es.mdh.se/publications/1797-}
}