You are required to read and agree to the below before accessing a full-text version of an article in the IDE article repository.

The full-text document you are about to access is subject to national and international copyright laws. In most cases (but not necessarily all) the consequence is that personal use is allowed given that the copyright owner is duly acknowledged and respected. All other use (typically) require an explicit permission (often in writing) by the copyright owner.

For the reports in this repository we specifically note that

  • the use of articles under IEEE copyright is governed by the IEEE copyright policy (available at http://www.ieee.org/web/publications/rights/copyrightpolicy.html)
  • the use of articles under ACM copyright is governed by the ACM copyright policy (available at http://www.acm.org/pubs/copyright_policy/)
  • technical reports and other articles issued by M‰lardalen University is free for personal use. For other use, the explicit consent of the authors is required
  • in other cases, please contact the copyright owner for detailed information

By accepting I agree to acknowledge and respect the rights of the copyright owner of the document I am about to access.

If you are in doubt, feel free to contact webmaster@ide.mdh.se

Concurrency defect localization in embedded systems using static code analysis: an evaluation

Publication Type:

Conference/Workshop Paper

Venue:

The 30th International Symposium on Software Reliability Engineering


Abstract

Defects with low manifestation probability, such as concurrency defects, are difficult to find during testing. When such a defect manifests into an error, the low likelihood can make it time-consuming to reproduce the error and find the root cause. Static Code Analysis (SCA) tools have been used in the industry for decades, mostly for compliance checking towards guidelines such as MISRA. Today, these tools are capable of sophisticated data and execution flow analysis. Our work, presented in this paper, evaluates the feasibility of using SCA tools for concurrency defect detection and localization. Earlier research has categorized concurrency defects. We use this categorization and develop an object-oriented C++ based test suite containing defects from each category. Secondly, we use known and real defects in existing products’ source code. With these two approaches, we perform the evaluation, using tools from some of the largest commercial actors in the field. Based on our results, we provide a discussion about how to use static code analysis tools for concurrency defect detection in complex embedded real-time systems.

Bibtex

@inproceedings{Johansson5618,
author = {Bjarne Johansson and Alessandro Papadopoulos and Thomas Nolte},
title = {Concurrency defect localization in embedded systems using static code analysis: an evaluation},
number = {30},
month = {October},
year = {2019},
booktitle = {The 30th International Symposium on Software Reliability Engineering},
url = {http://www.es.mdh.se/publications/5618-}
}