You are required to read and agree to the below before accessing a full-text version of an article in the IDE article repository.

The full-text document you are about to access is subject to national and international copyright laws. In most cases (but not necessarily all) the consequence is that personal use is allowed given that the copyright owner is duly acknowledged and respected. All other use (typically) require an explicit permission (often in writing) by the copyright owner.

For the reports in this repository we specifically note that

  • the use of articles under IEEE copyright is governed by the IEEE copyright policy (available at http://www.ieee.org/web/publications/rights/copyrightpolicy.html)
  • the use of articles under ACM copyright is governed by the ACM copyright policy (available at http://www.acm.org/pubs/copyright_policy/)
  • technical reports and other articles issued by M‰lardalen University is free for personal use. For other use, the explicit consent of the authors is required
  • in other cases, please contact the copyright owner for detailed information

By accepting I agree to acknowledge and respect the rights of the copyright owner of the document I am about to access.

If you are in doubt, feel free to contact webmaster@ide.mdh.se

COSTE: Complexity-based OverSampling TEchnique to alleviate the class imbalance problem in software defect prediction

Authors:

Shuo Feng , Jacky Keung , Xiao Yu , Yan Xiao , Kwabena Ebo Bennin , Md Alamgir Kabir , Miao Zhang

Publication Type:

Journal article

Venue:

Information and Software Technology


Abstract

Context: Generally, there are more non-defective instances than defective instances in the datasets used for software defect prediction (SDP), which is referred to as the class imbalance problem. Oversampling techniques are frequently adopted to alleviate the problem by generating new synthetic defective instances. Existing techniques generate either near-duplicated instances which result in overgeneralization (high probability of false alarm, ) or overly diverse instances which hurt the prediction model’s ability to find defects (resulting in low probability of detection, ). Furthermore, when existing oversampling techniques are applied in SDP, the effort needed to inspect the instances with different complexity is not taken into consideration.Objective: In this study, we introduce Complexity-based OverSampling TEchnique (COSTE), a novel oversampling technique that can achieve low and high simultaneously. Meanwhile, COSTE also performs better in terms of and , two effort-aware measures that consider the testing effort.Method: COSTE combines pairs of defective instances with similar complexity to generate synthetic instances, which improves the diversity within the data, maintains the ability of prediction models to find defects, and takes the different testing effort needed for different instances into consideration. We conduct experiments to compare COSTE with Synthetic Minority Oversampling TEchnique, Borderline-SMOTE, Majority Weighted Minority Oversampling TEchnique and MAHAKIL.Results: The experimental results on 23 releases of 10 projects show that COSTE greatly improves the diversity of the synthetic instances without compromising the ability of prediction models to find defects. In addition, COSTE outperforms the other oversampling techniques under the same testing effort. The statistical analysis indicates that COSTE’s ability to outperform the other oversampling techniques is significant under the statistical Wilcoxon rank sum test and Cliff’s effect size.Conclusion: COSTE is recommended as an efficient alternative to address the class imbalance problem in SDP.

Bibtex

@article{Feng6538,
author = {Shuo Feng and Jacky Keung and Xiao Yu and Yan Xiao and Kwabena Ebo Bennin and Md Alamgir Kabir and Miao Zhang},
title = {COSTE: Complexity-based OverSampling TEchnique to alleviate the class imbalance problem in software defect prediction},
volume = {51},
number = {6},
month = {September},
year = {2020},
journal = {Information and Software Technology},
url = {http://www.es.mdu.se/publications/6538-}
}