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Test Rig for MEMS-accelerometers
Publication Type:
Conference/Workshop Paper
Venue:
MSW 2010, Micronano System Workshop
Abstract
MEMS-accelerometers are rather cheap, small and reliable motion sensors that have found new
application areas and are available in a variety of performance. They exist in many different
performance, such as single, dual or triple axis, for high- or low-g application, with analog or digital
output, different packages and size etc. Their performance parameters also exist in a wide spectrum,
like high sensitivity, bandwidth, noise density, temperature range, shock tolerance etc. Moreover, there
are a variety of manufacturers that you can choose from. So when it is time to choose sensor, there are
many aspects and parameters to take in the consideration of choosing the right accelerometer. If it is
possible to managed to choose one sensor above all others, a question arises. How can you be sure that
the chosen sensor fulfils its requirement specification?
Bibtex
@inproceedings{Gerdtman1797,
author = {Christer Gerdtman and Maria Lind{\'e}n},
title = {Test Rig for MEMS-accelerometers},
editor = { G{\"o}ran Stemme, Niclas Roxhed and Wouter van der Wijngaart},
month = {May},
year = {2010},
booktitle = {MSW 2010, Micronano System Workshop},
url = {http://www.es.mdu.se/publications/1797-}
}